Smithsonian American Art Museum & National Portrait Gallery
McEvoy Auditorium | 8th and G Streets NW | Washington DC, 20001
February 20 – 21, 2014
This two-day international symposium will focus on recent advances in technology and instrumentation for the analysis of painted surfaces. You can download an announcement flyer here: Non-Invasive Analysis of Painted Surfaces Announcement
While non-destructive and micro-destructive analytical methods are often essential for the study and understanding of paintings, recent developments in portable and non-invasive instrumentation have led to growing interest in the applicability of techniques to the study of paintings. Further, as new instrumentation becomes commercially available and more affordable, conservators and scientists are able to use non-invasive techniques for monitoring and analysis in new ways.
A particular focus of the conference will be the interpretation of analytical results from portable instrumentation including colorimetry, imaging and X-ray fluorescence spectroscopy. The format of the conference will include papers and panel discussions.
Registration for this conference is required.
A schedule of speakers and registration instructions are listed under the current courses section on AIC’s site.
http://www.conservation-us.org/education/education/current-courses/non-invasive-analysis-of-painted-surfaces
Presented in partnership with the Lunder Conservation Center, ICOM-CC Paintings Working Group, ICOM-CC Scientific Research Working Group, and FAIC.
Image: Smithsonian American Art Museum’s Chief Conservator, Tiarna Doherty, studies x-radiographs of Constantino Brumidi’s study for the Rotunda of the Capitol Building. (Photography by Conor Doherty)